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Applied Scanning Probe Methods I

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Beschreibung

This volume examines the physical and technical foundation for recent progress in applied near-field scanning probe techniques. It constitutes a timely comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors,...

Beschreibung

This volume examines the physical and technical foundation for recent progress in applied near-field scanning probe techniques. It constitutes a timely comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. After laying the theoretical background of static and dynamic force microscopies, including sensor technology and tip characterization, contributions detail applications such as macro- and nanotribology, polymer surfaces, and roughness investigations. The final part on industrial research addresses special applications of scanning force nanoprobes such as atomic manipulation and surface modification, as well as single electron devices based on SPM. Scientists and engineers either using or planning to use SPM techniques will benefit from the international perspective assembled in the book.

Rezension

From the reviews:


"The editors have done an excellent job of maintaining a coherent theme throughout, while keeping the repetition of ideas to a minimum. It is therefore effective when read as a whole but will also find good use as a reference book."..…"This is an excellent book for all users of SPM interested in real technological applications".
Steven R. Schofield, School of Mathematical and Physical Sciences, University of Newcastle
Journal: "The Physicist", Vol. 41, No. 6, p. 200


"This book describes some of the many ways in which SPMs are being used in the development and characterisation of real nano technological processes and devices. The editors have done an excellent job of maintaining a coherent theme throughout … . It is therefore effective when read as a whole but will also find good use as a reference book. … This is an excellent book for all users of SPM interested in real technological applications." (Steven R Schofield, The Physicist, Vol. 41 (6), November/December, 2004)


"The focus of this book is recent, practical applications of scanning probe microscopy (SPM). Because it is written by leading experts in SPM techniques, the book is strongly recommended to those working in the emerging area of nanotechnology. … Each chapter contains the relevant references and the book ends with a comprehensive index." (Mircea Dragoman, Optics and Photonics News, April, 2006)

Produktdetails

Einband

Gebundene Ausgabe
Erscheinungsdatum

13.01.2004
Abbildungen

XX, 476 p.
Herausgeber Bharat Bhushan + weitere

Produktdetails

Einband

Gebundene Ausgabe
Erscheinungsdatum

13.01.2004
Abbildungen

XX, 476 p.
Herausgeber
Verlag Springer Berlin
Seitenzahl

476
Maße (L/B/H)

24,1/16/3,5 cm
Gewicht

950 g
Auflage

2004
Sprache

Englisch
ISBN

978-3-540-00527-8
Herstelleradresse

Spektrum-Akademischer Vlg
Slevogtstraße 3-5
69126 Heidelberg
DE

Email: ProductSafety@springernature.com

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  • Produktbild: Applied Scanning Probe Methods I
  • Part I: Scanning Probe Microscopy.- A. Schirmeisen, B. Ancykowski, H. Fuchs: Dynamic Force Microscopy. J.E. Houston: Interfacial Force Microscopy: Selected Applications. Volker Scherer, Michael Reinstaedtler, Walter Arnold: Atomic Force Microscopy with Lateral Modulation. E.Oesterschulze, R. Kassing: Sensor Technology for Scanning Probe Microscopy. J.S. Villarrubia: Tip Characterization for Dimensional Nanometrology.- Part II: Characterization.- Bharat Bhushan: Micro/Nanotribology and Materials Characterization Studies Using Scanning Probe Microscopy. Sergei Magonov: Visualization of Polymer Structures with Atomic Force Microscopy. Juergen Keller, Dietmar Vogel, Andreas Schubert, and Bernd Michel: Displacement and Strain Field Measurements from SPM Images. Ndubuisi G. Orji, Martha I. Sanchez, Jay Raja, and Theodore V. Vorburger: AFM Characterization of Semiconductor Line Edge Roughness. Redhouane Henda: Mechanical Properties of the Self-Assembled Organic Monolayers: Experimental Techniques and Modeling Approaches. LiShi and Arun Majumdar: Micro-Nano Scale Thermal Imaging Using Scanning Probe Microscopy. Gustavo Luengo, Frederic Leroy: The Science of Beauty at Small Scale. Applications of Scanning Probe Methods on Cosmetic Science.- Part III: Industrial Applications.- S. Hosaka: SPM Based Storage Using Atomic Manipulation and Surface Modification. J. Tominaga: Super Density Optical Data Storage by Near-Field Optics. R. Yamamoto, K. Sanada, S. Umemura. R: Capacitance Storage Using a Ferroelectric Medium and a Scanning Capacitance Microscope (SCM). K. Matsumoto: Room-Temperature Single Electron Devices Formed ba AFM Nano-Oxidation Process.